1. SJ/Z9154.1-87 (IEC444-1 (1986)) Measurement of quartz crystal unit parameters by zero phase technique in a π-network Part one: frequency and resonant resistance measurements.
2. SJ/Z9154.2-87 (IEC444-2) (1980) Measurement of quartz crystal unit parameters by zero phase technique in a π-network Part two: Phase offset method for measurement of motional capacitance of quartz crystal units
3. SJ/Z9154.3-87 (IEC444-3) Measurement of quartz crystal unit parameters by zero phase technique in a π-network Part 3: Basic method for the measurement of two-terminal parameters of quartz crystal units up to 200 MHz by phase technique in a π-network with compensation of the parallel capacitance co
4. SJ/T1212-1999(IEC444-69(1995) Measurement of quartz crystal unit parameters. Part six: Measurement of drive level dependency(DLD)
5. IEC68-2 Environmental test Part two: Various tests
6. GB2423 Environmental test standard of electric and electronic products
7. GJB360A-1996 (MIL-STD-202F) Testing methods of electronic and electrical component.
8. MIL-STD-883 Testing methods and procedures of microelectronics device